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    SAC
    2002
    ACM
    99views Applied Computing» more  SAC 2002»
    An evolutionary algorithm for reducing integrated-circuit test application time
    13 years 11 months ago
    An evolutionary algorithm for reducing integrated-circuit test application time
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    The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and...
    Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
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