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35
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ECML
2006
Springer
132
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Machine Learning
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ECML 2006
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Bayesian Active Learning for Sensitivity Analysis
14 years 3 months ago
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www.kyb.tuebingen.mpg.de
Abstract. Designs of micro electro-mechanical devices need to be robust against fluctuations in mass production. Computer experiments with tens of parameters are used to explore th...
Tobias Pfingsten
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