Sciweavers

DT
2006
109views more  DT 2006»
13 years 7 months ago
Test Consideration for Nanometer-Scale CMOS Circuits
The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
Kaushik Roy, T. M. Mak, Kwang-Ting (Tim) Cheng
IEEEAMS
2003
IEEE
14 years 23 days ago
Smart Doorplates - Toward an Autonomic Computing System
The last three decades proved Moore’s Law. We witnessed an exponential increase in processing power, memory capacity and communication bandwidth and we expect this increase to c...
Wolfgang Trumler, Faruk Bagci, Jan Petzold, Theo U...