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    ICCAD
    2006
    IEEE
    134views Hardware» more  ICCAD 2006»
    A delay fault model for at-speed fault simulation and test generation
    14 years 8 months ago
    A delay fault model for at-speed fault simulation and test generation
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    We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
    Irith Pomeranz, Sudhakar M. Reddy
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