MVA
1998
13 years 11 months ago
1998
In this paper, we present a fast method for the detection of die extrusion defects in IC packages. The optical and lighting set-up as well as the details of the algorithm used for ...
CVPR
2009
IEEE
14 years 7 months ago
2009
IEEE
1 Example-based super-resolution recovers missing high frequencies in a magnified image by learning the correspondence between co-occurrence examples at two different resolution le...