130
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MVA
1998
15 years 3 months ago
1998
In this paper, we present a fast method for the detection of die extrusion defects in IC packages. The optical and lighting set-up as well as the details of the algorithm used for ...
108
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CVPR
2009
IEEE
15 years 10 months ago
2009
IEEE
1 Example-based super-resolution recovers missing high frequencies in a magnified image by learning the correspondence between co-occurrence examples at two different resolution le...