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43
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ISVLSI
2006
IEEE
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ISVLSI 2006
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Dependability Analysis of Nano-scale FinFET circuits
14 years 5 months ago
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www.cse.psu.edu
FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous work have studied the performan...
Feng Wang 0004, Yuan Xie, Kerry Bernstein, Yan Luo
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