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31
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MR
2010
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Robotics
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MR 2010
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Automated inspection and classification of flip-chip-contacts using scanning acoustic microscopy
13 years 11 months ago
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www.pva-analyticalsystems.com
Industrial applications often require failure analysis methods working non-destructively, enabling either a rapid quality control or fault isolation and defect localization prior ...
S. Brand, P. Czurratis, P. Hoffrogge, M. Petzold
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