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ATS
2005
IEEE
121views Hardware» more  ATS 2005»
14 years 5 months ago
Compressing Functional Tests for Microprocessors
In the past, test data volume reduction techniques have concentrated heavily on scan test data content. However, functional vectors continue to be utilized because they target uni...
Kedarnath J. Balakrishnan, Nur A. Touba, Srinivas ...