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28
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DFT
2002
IEEE
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VLSI
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DFT 2002
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Gate-Delay Fault Diagnosis Using the Inject-and-Evaluate Paradigm
14 years 4 months ago
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larc.ee.nthu.edu.tw
We propose an algorithm for gate-delay fault diagnosis. It is based on the inject-and-evaluate paradigm [1], in which the fault site(s) are predicted through a series of injection...
Horng-Bin Wang, Shi-Yu Huang, Jing-Reng Huang
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