Sciweavers

DAC
2012
ACM
12 years 2 months ago
Improving gate-level simulation accuracy when unknowns exist
Unknown values (Xs) may exist in a design due to uninitialized registers or blocks that are powered down. Due to X-pessimism in gate-level logic simulation, such Xs cannot be hand...
Kai-Hui Chang, Chris Browy
VLSID
2008
IEEE
149views VLSI» more  VLSID 2008»
15 years 25 days ago
NBTI Degradation: A Problem or a Scare?
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
Kewal K. Saluja, Shriram Vijayakumar, Warin Sootka...