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    ATS
    2009
    IEEE
    138views Hardware» more  ATS 2009»
    Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks
    14 years 6 months ago
    Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks
    Download  www.cse.cuhk.edu.hk
    Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
    Yubin Zhang, Lin Huang, Feng Yuan, Qiang Xu
    claim paper
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