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61

ICEIS
2007
IEEE

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Relevant values: New metadata to provide insight on attribute values at schema level

15 years 10 months ago

Relevant values: New metadata to provide insight on attribute values at schema level

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Sonia Bergamaschi, Mirko Orsini, Francesco Guerra,...

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95

ICEIS
2007
IEEE

148views Information Technology» more ICEIS 2007»

Trends in business process analysis - from verification to process mining

15 years 10 months ago

Trends in business process analysis - from verification to process mining

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Wil M. P. van der Aalst

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