MVA
2007
14 years 29 days ago
2007
This paper discusses a physics-based imaging model of scanning electron microscopes (SEM). The purpose is to accurately examine the imaging process of a SEM, which has to be neces...
CVPR
2008
IEEE
14 years 1 months ago
2008
IEEE
In photometric stereo a robust method is required to deal with outliers, such as shadows and non-Lambertian reflections. In this paper we rely on a probabilistic imaging model tha...