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    IOLTS
    2009
    IEEE
    124views Hardware» more  IOLTS 2009»
    On-line characterization and reconfiguration for single event upset variations
    14 years 1 months ago
    On-line characterization and reconfiguration for single event upset variations
    Download  www.eecs.umich.edu
    The amount of physical variation among electronic components on a die is increasing rapidly. There is a need for a better understanding of variations in transient fault susceptibil...
    Kenneth M. Zick, John P. Hayes
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