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15
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IEICET
2008
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IEICET 2008
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Impact of Well Edge Proximity Effect on Timing
14 years 27 days ago
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www-ise2.ist.osaka-u.ac.jp
This paper studies impact of the well edge proximity effect on digital circuit delay, based on model parameters extracted from test structures in an industrial 65nm wafer process. ...
Toshiki Kanamoto, Yasuhiro Ogasahara, Keiko Natsum...
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