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    CONSTRAINTS
    2007
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    Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic
    14 years 13 days ago
    Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic
    Download  www.crt.umontreal.ca
    In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
    Francisco Azevedo
    claim paper
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