Sciweavers

APCSAC
2005
IEEE
14 years 13 days ago
Resource-Driven Optimizations for Transient-Fault Detecting SuperScalar Microarchitectures
Increasing microprocessor vulnerability to soft errors induced by neutron and alpha particle strikes prevents aggressive scaling and integration of transistors in future technologi...
Jie Hu, Greg M. Link, Johnsy K. John, Shuai Wang, ...