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35
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VTS
2002
IEEE
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VTS 2002
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LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects
14 years 5 months ago
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www.pldworld.com
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
Krishna Sekar, Sujit Dey
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