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    MTDT
    2003
    IEEE
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    Systematic Memory Test Generation for DRAM Defects Causing Two Floating Nodes
    14 years 4 months ago
    Systematic Memory Test Generation for DRAM Defects Causing Two Floating Nodes
    Download  ce.et.tudelft.nl
    Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...
    Zaid Al-Ars, A. J. van de Goor
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