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19
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DFT
2005
IEEE
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VLSI
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DFT 2005
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On the Modeling and Analysis of Jitter in ATE Using Matlab
14 years 2 months ago
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www.ece.neu.edu
This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio L...
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