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159
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MTV
2005
IEEE
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MTV 2005
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Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
15 years 8 months ago
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www.cad.polito.it
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
Paolo Bernardi, Ernesto Sánchez, Massimilia...
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