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    Test structures for dielectric spectroscopy of thin films at microwave frequencies
    13 years 11 months ago
    Test structures for dielectric spectroscopy of thin films at microwave frequencies
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    This work describes the application of two different test structures to execute broadband microwave measurements of the dielectric constant of ceramic thin films. Coplanar wavegui...
    Nicola Delmonte, B. E. Watts, G. Chiorboli, P. Cov...
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