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    VLSID
    2005
    IEEE
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    Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm Circuits
    14 years 12 months ago
    Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm Circuits
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    An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
    Shengqi Yang, Wayne Wolf, Narayanan Vijaykrishnan,...
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