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31
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GLVLSI
2002
IEEE
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VLSI
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GLVLSI 2002
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Test generation for resistive opens in CMOS
14 years 1 months ago
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www.cecs.uci.edu
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
Arun Krishnamachary, Jacob A. Abraham
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