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VLSID
2007
IEEE
152views VLSI» more  VLSID 2007»
14 years 12 months ago
An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect
With scaling of CMOS technologies, sub-threshold, gate and reverse biased junction band-to-band-tunneling leakage have increased dramatically. Together they account for more than 2...
Ashesh Rastogi, Wei Chen, Alodeep Sanyal, Sandip K...