GLVLSI
2007
IEEE
14 years 3 months ago
2007
IEEE
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
WAIM
2007
Springer
14 years 5 months ago
2007
Springer
The constructions of Haar wavelet synopses for large data sets have proven to be useful tools for data approximation. Recently, research on constructing wavelet synopses with a gua...
MICCAI
2003
Springer
15 years 9 days ago
2003
Springer
Abstract. We describe a new approach to predicting the maximum target registration error for fiducial registration. The approach is based on the analysis of a spatial stiffness mod...