GLVLSI
2007
IEEE
13 years 10 months ago
2007
IEEE
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
WAIM
2007
Springer
14 years 29 days ago
2007
Springer
The constructions of Haar wavelet synopses for large data sets have proven to be useful tools for data approximation. Recently, research on constructing wavelet synopses with a gua...
MICCAI
2003
Springer
14 years 7 months ago
2003
Springer
Abstract. We describe a new approach to predicting the maximum target registration error for fiducial registration. The approach is based on the analysis of a spatial stiffness mod...