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34
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MTDT
2003
IEEE
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MTDT 2003
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A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories
14 years 4 months ago
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ir.lib.nthu.edu.tw
Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation— a large memory may need to be ...
Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu L...
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