DAC
2012
ACM
12 years 2 months ago
2012
ACM
Full-chip thermal monitoring is an important and challenging issue in today’s microprocessor design. In this paper, we propose a new information-theoretic framework to quantitat...
MICRO
2012
IEEE
12 years 2 months ago
2012
IEEE
The past 10 years have delivered two significant revolutions. (1) Microprocessor design has been transformed by the limits of chip power, wire latency, and Dennard scaling—leadi...
MICRO
2011
IEEE
13 years 3 months ago
2011
IEEE
Abstract—Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is especially daunting because it happens so rapidly. We measure and ch...
ISQED
2011
IEEE
13 years 3 months ago
2011
IEEE
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
MICRO
2005
IEEE
14 years 5 months ago
2005
IEEE
We develop a microprocessor design that tolerates hard faults, including fabrication defects and in-field faults, by leveraging existing microprocessor redundancy. To do this, we...