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    Characterization of semiconductor interfaces using a modified mixed mode bending apparatus
    13 years 11 months ago
    Characterization of semiconductor interfaces using a modified mixed mode bending apparatus
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    This research deals with the experimental assessment of the strength of bi-material interfaces as a function of mode mixity, focusing on two dimensional problems. A modified mixed...
    J. Thijsse, Olaf van der Sluis, J. A. W. van Domme...
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