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43
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DAC
2005
ACM
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Computer Architecture
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DAC 2005
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StressTest: an automatic approach to test generation via activity monitors
15 years 15 days ago
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www.eecs.umich.edu
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
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