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ATS
2009
IEEE
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ATS 2009
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M-IVC: Using Multiple Input Vectors to Minimize Aging-Induced Delay
13 years 11 months ago
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Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...
Song Jin, Yinhe Han, Lei Zhang 0008, Huawei Li, Xi...
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