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36
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ICAPR
2005
Springer
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Pattern Recognition
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ICAPR 2005
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Texture Exemplars for Defect Detection on Random Textures
14 years 7 months ago
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www.cs.bris.ac.uk
We present a new approach to detecting defects in random textures which requires only very few defect free samples for unsupervised training. Each product image is divided into ove...
Xianghua Xie, Majid Mirmehdi
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