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MVA
1994
145views Computer Vision» more  MVA 1994»
14 years 26 days ago
Machine Vision Based Inspection of Textile Fabrics
Several issues on automatic inspection of textile fabrics are discussed in this paper. To avoid the intense computation for real time inspection, we suggest a parallel pyramid har...
Chuanjun Wang, Chih-Ho Yu
MVA
1994
104views Computer Vision» more  MVA 1994»
14 years 26 days ago
3D-Environment Measurement System for Large-Scale Structure Manufacturing
This papcr presents a 3D-environment nieasurcmcnt systeni for large-scale structure manufacturing. First, a niethod and systeni for generating as-built data are shown. Then a came...
Toshiyuki Aoki, Kohji Kamejima
MVA
1994
14 years 26 days ago
A Procedure for Segmenting Touching Numbers in Cadastral Maps
We present a procedure to split (or segment) touching numerals. We are neither assuming a dominant orientation for the text direction nor long character strings. The basic idea is...
Gladys Monagan
MVA
1994
110views Computer Vision» more  MVA 1994»
14 years 26 days ago
Recognition of Cartographic Symbols
A hybrid (statistical/structural)approach is presented, for scale- and orientation-invariant recognition of multi-component cartographic symbols. A decision-tree classifier (DTC) ...
Sushil Bhattacharjee, Gladys Monagan
MVA
1994
14 years 26 days ago
A Visual Navigation System for Autonomous Underwater Vehicle
Jian-Gang Wang, Ying-Ming Hao, Hong-Kai Cao, Yong ...
MVA
1994
14 years 26 days ago
A High Level Merging Tool in Image Segmentation Applications
This paper deals with "on the fly" segmentation on sliding images. We describe a quality control industrial application for which that type of image analysis is an elega...
Philippe Charnier, Ehoud Ahronovitz, Christophe Fi...
MVA
1994
119views Computer Vision» more  MVA 1994»
14 years 26 days ago
Development of Surface Inspection Machine for Organic Photo Conductor(OPC)
The OPC is one of the most important component in the electrophotography process. So far its surface defects which degrade print quality were inspected by human-eye. We have devel...
Osamu Nakayama, Shinji Kobayashi, Katsuyuki Omura,...