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    VLSID
    2007
    IEEE
    94views VLSI» more  VLSID 2007»
    A Reduced Complexity Algorithm for Minimizing N-Detect Tests
    15 years 4 months ago
    A Reduced Complexity Algorithm for Minimizing N-Detect Tests
    Download  www.eng.auburn.edu
    ? We give a new recursive rounding linear programming (LP) solution to the problem of N-detect test minimzation. This is a polynomialtime solution that closely approximates the exa...
    Kalyana R. Kantipudi, Vishwani D. Agrawal
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