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TCAD
2002
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TCAD 2002
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DS-LFSR: a BIST TPG for low switching activity
13 years 8 months ago
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dit.upc.es
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
Seongmoon Wang, Sandeep K. Gupta
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