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53
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ECCV
2002
Springer
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Computer Vision
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ECCV 2002
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Multi-scale EM-ICP: A Fast and Robust Approach for Surface Registration
15 years 2 months ago
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www-sop.inria.fr
We investigate in this article the rigid registration of large sets of points, generally sampled from surfaces. We formulate this problem as a general Maximum-Likelihood (ML) estim...
Sébastien Granger, Xavier Pennec
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