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VTS
1996
IEEE
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VTS 1996
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Optimal voltage testing for physically-based faults
14 years 4 months ago
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faculty.cs.tamu.edu
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
Yuyun Liao, D. M. H. Walker
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