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ICCAD
2007
IEEE
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ICCAD 2007
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A selective pattern-compression scheme for power and test-data reduction
14 years 8 months ago
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vda.ee.nctu.edu.tw
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
Chia-Yi Lin, Hung-Ming Chen
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