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TCAD
2010
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TCAD 2010
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Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies
13 years 10 months ago
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www-ise2.ist.osaka-u.ac.jp
—With the scaling of complementary metal–oxide– semiconductor (CMOS) technology into the nanometer regime, the overshooting effect due to the input-to-output coupling capacit...
Zhangcai Huang, Atsushi Kurokawa, Masanori Hashimo...
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