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ICCAD
2006
IEEE
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ICCAD 2006
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Robust estimation of parametric yield under limited descriptions of uncertainty
14 years 7 months ago
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www.cecs.uci.edu
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
Wei-Shen Wang, Michael Orshansky
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