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    CVPR
    2006
    IEEE
    174views Computer Vision» more  CVPR 2006»
    Learning Non-Metric Partial Similarity Based on Maximal Margin Criterion
    14 years 5 months ago
    Learning Non-Metric Partial Similarity Based on Maximal Margin Criterion
    Download  parnec.nuaa.edu.cn
    The performance of many computer vision and machine learning algorithms critically depends on the quality of the similarity measure defined over the feature space. Previous works...
    Xiaoyang Tan, Songcan Chen, Jun Li, Zhi-Hua Zhou
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