DSN
2011
IEEE
13 years 9 days ago
2011
IEEE
—As process technology shrinks devices, circuits experience accelerated wearout. Monitoring wearout will be critical for improving the efficiency of error detection and correctio...
ICRA
2002
IEEE
14 years 5 months ago
2002
IEEE
This paper describes TEMPEST, a planner that enables a solar-powered rover to reason about path selection and event placement in terms of available solar energy and anticipated po...