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    DSD
    2007
    IEEE
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    Fault Diagnosis in Integrated Circuits with BIST
    14 years 6 months ago
    Fault Diagnosis in Integrated Circuits with BIST
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    This paper presents an optimized fault diagnosing procedure applicable in Built-in Self-Test environments. Instead of the known approach based on a simple bisection of patterns in...
    Raimund Ubar, Sergei Kostin, Jaan Raik, Teet Evart...
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