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    VLSID
    2007
    IEEE
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    Soft Error Rate Analysis for Combinational Logic Using An Accurate Electrical Masking Model
    14 years 11 months ago
    Soft Error Rate Analysis for Combinational Logic Using An Accurate Electrical Masking Model
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    Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET mode...
    Feng Wang 0004, Yuan Xie, R. Rajaraman, Balaji Vai...
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