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VLSID
2008
IEEE
142views VLSI» more  VLSID 2008»
14 years 6 months ago
Incorporating PVT Variations in System-Level Power Exploration of On-Chip Communication Architectures
With the shift towards deep sub-micron (DSM) technologies, the increase in leakage power and the adoption of poweraware design methodologies have resulted in potentially significa...
Sudeep Pasricha, Young-Hwan Park, Fadi J. Kurdahi,...