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ISCAS
2003
IEEE
102views Hardware» more  ISCAS 2003»
14 years 5 months ago
A deterministic dynamic element matching approach to ADC testing
A deterministic dynamic element matching (DEM) approach to ADC testing is introduced and compared with a common random DEM method. With both approaches, a highly non-ideal DAC is ...
Beatriz Olleta, Lance Juffer, Degang Chen, Randall...