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26
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VTS
2002
IEEE
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VTS 2002
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Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models
14 years 1 months ago
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www.ece.unm.edu
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
Abhishek Singh, Jim Plusquellic, Anne E. Gattiker
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