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SIGGRAPH
1992
ACM
151
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Computer Graphics
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SIGGRAPH 1992
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Measuring and modeling anisotropic reflection
14 years 3 months ago
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www.cs.virginia.edu
A new device for measuringthe spatial reflectancedistributionsof surfaces is introduced, along with a new mathematical model of sniaorropic reflectance. The reflectance model pres...
Gregory J. Ward
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