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27
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ASPDAC
2008
ACM
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ASPDAC 2008
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Reliability-aware design for nanometer-scale devices
14 years 1 months ago
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www.dacya.ucm.es
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...
David Atienza, Giovanni De Micheli, Luca Benini, J...
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