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TCAD
2008
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TCAD 2008
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Self-Adaptive Data Caches for Soft-Error Reliability
14 years 16 days ago
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web.njit.edu
Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches' dominant share in die area and tr...
Shuai Wang, Jie S. Hu, Sotirios G. Ziavras
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